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Volumn 20, Issue 1, 1997, Pages 50-55

Return path inductance in measurements of package inductance matrixes

Author keywords

Bandwidth; Inductance matrix; Partial inductance; Reference; Repeatability

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; ELECTRON DEVICE TESTING; ELECTRONICS PACKAGING; INDUCTANCE MEASUREMENT; MATHEMATICAL TRANSFORMATIONS; MATRIX ALGEBRA;

EID: 0031077608     PISSN: 10709894     EISSN: None     Source Type: Journal    
DOI: 10.1109/96.554526     Document Type: Article
Times cited : (15)

References (7)
  • 2
    • 33748861346 scopus 로고
    • Electrical characterization of bonding wires
    • C.-T. Tsai, H. Andersen, and W.-Y. Yip, "Electrical characterization of bonding wires," in Proc. ISHM, 1994, pp. 479-484.
    • (1994) Proc. ISHM , pp. 479-484
    • Tsai, C.-T.1    Andersen, H.2    Yip, W.-Y.3
  • 6
    • 0001032562 scopus 로고
    • Inductance calculations in a complex integrated circuit environment
    • Sept.
    • A. E. Ruehli, "Inductance calculations in a complex integrated circuit environment," IBM J. Res. Develop., pp. 470-481, Sept. 1972.
    • (1972) IBM J. Res. Develop. , pp. 470-481
    • Ruehli, A.E.1
  • 7
    • 0026386141 scopus 로고
    • Groundbounce in ASIC's: Model and test results
    • Aug. 12-16
    • L. Diaz-Olavarrieta, "Groundbounce in ASIC's: Model and test results," in Int. Symp. Electromag. Compat., Aug. 12-16, 1991, pp. 387-392.
    • (1991) Int. Symp. Electromag. Compat. , pp. 387-392
    • Diaz-Olavarrieta, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.