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Volumn 20, Issue 1, 1997, Pages 50-55
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Return path inductance in measurements of package inductance matrixes
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Author keywords
Bandwidth; Inductance matrix; Partial inductance; Reference; Repeatability
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Indexed keywords
ELECTRIC CURRENT MEASUREMENT;
ELECTRON DEVICE TESTING;
ELECTRONICS PACKAGING;
INDUCTANCE MEASUREMENT;
MATHEMATICAL TRANSFORMATIONS;
MATRIX ALGEBRA;
MEASUREMENT RETURN PATH;
PACKAGE INDUCTANCE MATRIXES;
PARTIAL INDUCTANCE;
RETURN PATH INDUCTANCE;
CIRCUIT THEORY;
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EID: 0031077608
PISSN: 10709894
EISSN: None
Source Type: Journal
DOI: 10.1109/96.554526 Document Type: Article |
Times cited : (15)
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References (7)
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