Uniformity and interfaces in ion-beam deposited Al/Ni multilayers

Journal of Materials Research

Volumn 12, Issue 2, 1997, Pages 385-391

  Edelstein, A S ^a   Everett, R K ^a   Perepezko, J H ^b   Da Silva Bassani, M H ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b University of Wisconsin Madison   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; DIFFERENTIAL SCANNING CALORIMETRY; DISLOCATIONS (CRYSTALS); INTERFACES (MATERIALS); INTERMETALLICS; ION BEAMS; NICKEL; REACTION KINETICS; SPUTTER DEPOSITION; X RAY DIFFRACTION ANALYSIS;

MODULATION WAVELENGTH;

MULTILAYERS;

EID: 0031076730     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1997.0055     Document Type: Article

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