An integrated CMOS time interval measurement system with subnanosecond resolution for the WA-98 calorimeter

IEEE Journal of Solid-State Circuits

Volumn 32, Issue 2, 1997, Pages 198-205

  Simpson, Michael L ^a,b,c,d   Britton, Charles L ^a,b,c,d,e   Wintenberg, Alan L ^a,b,c,d   Young, Glenn R ^b,f,g,h  

^a IEEE   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF TENNESSEE   (United States)

^d UNIVERSITY OF TENNESSEE   (United States)

^e ORNL Instrum Controls Div E

^f UNIVERSITY OF TENNESSEE   (United States)

^g MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^h AMERICAN PHYSICAL SOCIETY   (United States)

Author keywords

Instrumentation; Nuclear electronics; Time measurements

Indexed keywords

ANALOG TO DIGITAL CONVERSION; AUTOMATIC TESTING; DELAY CIRCUITS; DISCRIMINATORS; INDUSTRIAL ELECTRONICS; MEDICAL IMAGING; PHOTOMULTIPLIERS; TIME MEASUREMENT;

CALORIMETER WA 98; CONSTANT FRACTION DISCRIMINATOR (CFD); NUCLEAR ELECTRONICS; TIME TO AMPLITUDE CONVERTER (TAC);

CMOS INTEGRATED CIRCUITS;

EID: 0031075720     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.551911     Document Type: Article

References (12)

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