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Volumn 43, Issue 3 PART 2, 1996, Pages 1695-1699
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A monolithic, constant-fraction discriminator using distributed R-C delay line shaping
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Author keywords
[No Author keywords available]
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Indexed keywords
ARMING DISCRIMINATOR;
CONSTANT FRACTION SHAPING;
DISTRIBUTED R C DELAY LINE SHAPING;
MONOLITHIC CONSTANT FRACTION DISCRIMINATOR;
N WELL PROCESS;
POLYSILICON;
RELATIVISTIC HEAVY ION COLLIDER;
SERPENTIVE LAYER;
ZERO CROSSING DISCRIMINATOR;
CALORIMETERS;
CMOS INTEGRATED CIRCUITS;
COLLIDING BEAM ACCELERATORS;
ELECTRIC DELAY LINES;
MONOLITHIC INTEGRATED CIRCUITS;
PARTICLE DETECTORS;
PHOSPHORS;
PHOTOMULTIPLIERS;
SEMICONDUCTING SILICON COMPOUNDS;
DISCRIMINATORS;
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EID: 0030173829
PISSN: 00189499
EISSN: None
Source Type: Journal
DOI: 10.1109/23.507173 Document Type: Article |
Times cited : (21)
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References (7)
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