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Volumn 13, Issue 1, 1997, Pages 12-16
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Optimal source control and resolution in nondestructive testing
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Author keywords
[No Author keywords available]
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Indexed keywords
DEFECTS;
EIGENVALUES AND EIGENFUNCTIONS;
ELECTRIC CURRENTS;
MATHEMATICAL MODELS;
NONDESTRUCTIVE EXAMINATION;
OPTIMIZATION;
PERTURBATION TECHNIQUES;
VARIATIONAL TECHNIQUES;
DAMAGE DETECTION;
STRUCTURAL ANALYSIS;
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EID: 0031075271
PISSN: 09344373
EISSN: None
Source Type: Journal
DOI: 10.1007/BF01198370 Document Type: Article |
Times cited : (4)
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References (8)
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