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Volumn 35, Issue 1-4, 1997, Pages 477-480

The SCALPEL proof of concept system

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON SCATTERING; INTEGRATED CIRCUIT MANUFACTURE; INTERFEROMETERS; LASER APPLICATIONS; MASKS; POSITION MEASUREMENT; SERVOMECHANISMS; SYSTEMS ANALYSIS;

EID: 0031072164     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(96)00189-X     Document Type: Article
Times cited : (13)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.