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Volumn 9, Issue 4, 1996, Pages 663-676
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Resist design considerations for direct write and projection electron-beam lithography technologies
a a a a a a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0040257673
PISSN: 09149244
EISSN: None
Source Type: Journal
DOI: 10.2494/photopolymer.9.663 Document Type: Article |
Times cited : (6)
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References (6)
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