In situ probing of the near-surface properties of heterogeneous catalysts under reaction conditions: An introduction to total electron-yield XAS

Journal of Molecular Catalysis A: Chemical

Volumn 119, Issue 1-3, 1997, Pages 357-365

  Schroeder, Sven L M ^a,b   Moggridge, Geoffrey D ^a   Rayment, Trevor ^a   Lambert, Richard M ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

EXAFS; In situ; Probing depth; SEXAFS; Total electron yield; XAFS

Indexed keywords

EID: 0031008292     PISSN: 13811169     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1381-1169(96)00499-2     Document Type: Article

References (40)

1. R.A. van Nordstrand, Adv. Catal. 12 (1960) 149.
2. J. Evans, in: Catalysis, Vol. 8, The Royal Society of Chemistry, Cambridge, 1989, p. 1.
3. R. Prins and D.C. Koningsberger, in: D.C. Koningsberger and R. Prins (Eds.), X-Ray Absorption. Principles, Applications, Techniques of EXAFS, SEXAFS and XANES (Chemical Analysis), Vol. 92, Wiley, New York, Chichester, Brisbane, Toronto, Singapore, 1988, p. 321.
4. P. Johnston and P.B. Wells, Radiat. Phys. Chem. 45 (1995) 393.
5. B.L. Henke, E.M. Gullikson and J.C. Davis, At. Data Nucl. Data Tables 54 (1993) 181.
6. N.J. Shevchik and D.A. Fischer, Rev. Sci. Instrum. 50 (1979) 577.
7. C.E. Bouldin, R.A. Forman and M.I. Bell, Phys. Rev. B 35 (1987) 1429.
8. S.L.M. Schroeder, G.D. Moggridge, R.M. Ormerod, T. Rayment and R.M. Lambert, Surf Sci. Lett. 324 (1995) L371; Surf Sci. Lett. 329 (1995) L612.
9. S.L.M. Schroeder, G.D. Moggridge, R.M. Ormerod, T. Rayment and R.M. Lambert, Surf Sci. Lett. 324 (1995) L371; Surf Sci. Lett. 329 (1995) L612.
10. A. Erbil, C.S. Cargill, III, R. Frahm and R.F. Boehme, Phys. Rev. B 37 (1988) 2450.
11. W.T. Elam, J.P. Kirkland, R.A. Neiser and P.D. Wolf, Phys. Rev. B 38 (1988) 26.
12. G.D. Moggridge, T. Rayment, R.M. Ormerod, M.A. Morris and R.M. Lambert, Nature 358 (1992) 658.
13. K.M. Kemner, Z. Wang, R.A. Mayanovic and B.A. Bunker, Nucl. Instrum. Methods B 71 (1992) 345.
14. T. Girardeau, J. Mimault, M. Jaouen, P. Chartier and G. Tourillon, Phys. Rev. B 46 (1992) 7144.
15. J. Pant and T.M. Hayes, Rev. Sci. Instrum. 65 (1994) 3389.
16. G.D. Moggridge, S.L.M. Schroeder, R.M. Lambert and T. Rayment, Nucl. Instrum. Methods B 97 (1995) 28.
17. S.L.M. Schroeder, G.D. Moggridge, R.M. Lambert and T. Rayment, in preparation.
18. S.L.M. Schroeder, Ph.D. thesis, University of Cambridge (1996).
19. S.L.M. Schroeder, Solid State Commun. 98 (1996) 405.
20. B. Sitar, G.I. Merson, V.A. Chechin and Y.A. Budagov, Ionization Measurements in High Energy Physics (Springer Tracts in Modern Physics), Vol. 124, Springer-Verlag, Berlin, 1993.
21. K. Kleinknecht, Detectors for Particle Radiation, Cambridge University Press, Cambridge, London, New York, 1986.
22. S. Hanany, P.S. Shaw, Y. Liu, A. Santangelo, P. Kaaret and R. Novick, Phys. Rev. B 48 (1993) 701.
23. B.L. Henke, J.P. Knauer and K. Premaratne, J. Appl. Phys. 52 (1981) 1509.
24. H. Seiler, Z. Angew. Phys. 22 (1967) 249.
25. D.C. Joy, Monte Carlo Modelling for Electron Microscopy and Microanalysis (Oxford Series in Optical & Imaging Sciences), Vol. 9, Oxford University Press, New York, 1995.
26. S. Luo and D.C. Joy, Scanning Microsc. 4 (1990) 127.
27. D.C. Joy, J. Microsc. Oxford 147 (1987) 51.
28. R. Browning, T.Z. Li, B. Chui, J. Ye, R.F.W. Pease, Z. Czyzewski and D.C. Joy, J. Appl. Phys. 76 (1994) 2016.
29. M.O. Krause, J. Phys. Chem. Ref. Data 8 (1979) 307.
30. L. Tröger, D. Arvanitis, K. Baberschke, H. Michaelis, U. Grimm and E. Zschech, Phys. Rev. B 46 (1992) 3283.
31. J. Goulon, C. Goulon-Ginet, R. Cortes and J.M. Dubois, J. Phys. Paris 43 (1982) 539.
32. T.M. Hayes and J.B. Boyce, Solid State Phys. 37 (1982) 173.
33. P.H. Citrin, Surf. Sci. 299-300 (1994) 199.
34. J. Haase and A.M. Bradshaw, in: R.Z. Bachrach (Ed.), Synchrotron Radiation Research: Advances in Surface and Interface Science, Vol. 2, Issues and Technology, Plenum Press, New York, 1992, p. 55.
35. J. Stöhr, in: D.C. Koningsberger and R. Prins (Eds.), X-Ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS and XANES, Wiley, New York, Chichester, 1988, p. 443.
36. S.M. Heald, in: D.C. Koningsberger and R. Prins (Eds.), X-Ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS and XANES, Wiley, New York, Chichester, Brisbane, Toronto, Singapore, 1988, p. 87.
37. J. Jaklevic, J.A. Kirby, M.P. Klein, A.S. Robertson, G.S. Brown and P. Eisenberger, Solid State Commun. 23 (1977) 679.
38. J.L. Gland, in: R. Vanselow and R. Howe (eds.), Chemistry and Physics of Solid Surfaces VII (Springer Series in Surface Sciences 10), Springer Verlag, Berlin, Heidelberg, New York, 1988, p. 221.
39. J.G. Chen, B.D. DeVries, J.T. Lewandowsky and R.B. Hall, Catal. Lett. 23 (1994) 25.
40. S.M. Davis, G. Meitzner, D.A. Fischer and J.L. Gland, J. Catal. 142 (1993) 368.