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Volumn 108, Issue 3, 1996, Pages 282-289
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Secondary ion and electron yield measurements for surfaces bombarded with large molecular ions
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001695717
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-583X(95)01060-2 Document Type: Article |
Times cited : (39)
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References (21)
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