Correlation between topographic and magnetic properties of electrochemically prepared nickel films

Journal of Magnetism and Magnetic Materials

Volumn 165, Issue 1-3, 1997, Pages 199-201

  Bubendorff, J L ^a   Pflaum, J ^b   Huebner, E ^b   Raiser, D ^a   Bucher, J P ^a   Pelzl, J ^b  

^a INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

^b RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

Atomic force microscopy; Ferromagnetic resonance; Thin films electrodeposited; Thin films topography

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; ELECTRODEPOSITION; FERROMAGNETIC RESONANCE; GLASS; GOLD; MAGNETIC PROPERTIES; METALLIC FILMS; MICA; NICKEL; SUBSTRATES;

NICKEL FILMS; TOPOGRAPHIC PROPERTIES;

MAGNETIC THIN FILMS;

EID: 0030871501     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(96)00506-9     Document Type: Article

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