Sensitivity and fading characteristics of the 25 μm pixel size Imaging Plate for transmission electron microscopes

Journal of Electron Microscopy

Volumn 45, Issue 3, 1996, Pages 232-235

  Taniyama, Akira ^a   Shindo, Daisuke ^a   Oikawa, Tetsuo ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b JEOL LTD   (Japan)

Author keywords

Fading; Imaging Plate; Quantitative analysis; Repeated read out; Transmission electron microscope

Indexed keywords

ELECTRONS; TRANSMISSION ELECTRON MICROSCOPY;

DYNAMIC RANGE; ELECTRON INTENSITY; FADING; FADING CHARACTERISTICS; IMAGING PLATE; PIXEL SIZE; REPEATED READ-OUT; SENSITIVITY CHARACTERISTICS; TRANSMISSION ELECTRON; TRANSMISSION ELECTRON MICROSCOPE;

PIXELS;

EID: 0001159984     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023437     Document Type: Article

References (8)

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