Extraction of thermal time constant in HBTs using small signal measurements

Electronics Letters

Volumn 33, Issue 2, 1997, Pages 165-167

  Bruce, S ^a   Trasser, A ^b   Birk, M ^b   Rydberg, A ^a   Schumacher, H ^b  

^a UPPSALA UNIVERSITY   (Sweden)

^b UNIVERSITY OF ULM   (Germany)

Author keywords

Heterojunction bipolar transistors; Semiconductor device characterisation

Indexed keywords

FREQUENCY DOMAIN ANALYSIS; MEASUREMENT THEORY; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE TESTING; THERMAL CONDUCTIVITY OF SOLIDS;

SMALL SIGNAL MEASUREMENTS; THERMAL TIME CONSTANT;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 0030836826     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19970102     Document Type: Article

References (5)

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2. ZAREBSKI, J., and GORECKI, K.: 'A method of the BJT transient thermal impedance measurement with double junction calibration'. 11th Annual IEEE Semiconductor Thermal Measurement and Management Symp., 1995, pp. 80-82
3. JAKOPOVIC, Z., BENCIC, Z., and ZUNAC, R.: 'A correction of measured power MOSFET's normalized temperature response because of a case temperature rise'. 5th European Conf. Power Electronics and Applications, Brighton, England, 1993, 2, pp. 143-148
4. BRUCE, S., RYDBERG, A., SCHUMACHER, H., ERBEN, U., LUY, J.-F., KARLSTEEN, M., and WILLANDER, M.: 'Development, implementation and verification of a physics-based Si/SiGe HBT model for millimeter-wave non-linear circuit simulations'. 26th European Microwave Conf., Prague, Czech Republic, 1996, 2, pp. 903-905
5. DAWSON, D.E., GUPTA, A.K., and SALIB, M.L.: 'CW measurement of HBT thermal resistance', IEEE Trans., 1992, ED-39, (10), pp. 2235-2239