Stitching interferometry: Principles and algorithms

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2778, Issue PART 2, 1996, Pages 1062-1063

  Fan, Y J ^a   Velzel, C H F ^b   Struik, K G ^a   Schellekens, P H J ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3743126300     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. Hariharan.P: Inter lerometric metrology: current trends and future prospects, v 816. 2 - 18. PROCEEDINGS SPIE.1987.
2. Lowman.A.E. & Greivenkamp.J.E.: Interferometer induced wave front errors when testing in a non-null configuration, v 2004. 173- 180. PROCEEDINGS SPIE. 1993.
3. Malacara.D: Optical shop testing. 2nd ed.. New york: John wiley & Sons. 1993.
4. Stahl.P: Aspheric surface testing techniques, v 1332. 66 - 76. PROCEEDINGS SPIE. 1990.
5. Bom.M. & Wolf.E.: Principles of optics. 6th ed., Pergamon, 1984.