Models for hydrogen extraction from the passivated Si(100) surface induced by the scanning tunneling microscope

Physica Status Solidi (A) Applied Research

Volumn 159, Issue 1, 1997, Pages 91-104

  Kratzer, P ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DESORPTION; DIELECTRIC MATERIALS; ELECTRIC FIELD EFFECTS; EXTRACTION; HYDROGEN; MATHEMATICAL MODELS; MODIFICATION; MOLECULAR VIBRATIONS; PASSIVATION; SCANNING TUNNELING MICROSCOPY;

ATOMIC MANIPULATION; VIBRATIONAL PUMPING;

SEMICONDUCTING SILICON;

EID: 0030702184     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(199701)159:1<91::AID-PSSA91>3.0.CO;2-M     Document Type: Article

References (32)

1. R. S. BECKER, G. S. HIGASHI, Y. L. CHABAL, and A. J. BECKER, Phys. Rev. Lett. 65, 1917 (1990).
2. J. J. BOLAND, Phys. Rev. Lett. 67, 1539 (1991).
3. J. W. LYDING, T.-C. SHEN, J. S. HUBACEK, J. R. TUCKER, and G. C. ABELN, Appl. Phys. Lett. 64, 2010 (1994).
4. T.-C. SHEN, C. WANG, G. C. ABELN, J. R. TUCKER, J. W. LYDING, Ph. AVOURIS, and R. E. WALKUP, Science 268, 1590 (1995).
5. J. A. DAGATA, J. SCHNEIR, H. H. HARARY, C. J. EVANS, M. T. POSTEK, and J. BENNET, Appl. Phys. Lett. 56, 2001 (1990).
6. E. S. SNOW, P. M. CAMPBELL, and B. V. SHANABROOK, Appl. Phys. Lett. 63, 3488 (1993).
7. N. KRAMER, H. BIRK, J. JORRITSMA, and C. SCHÖNENBERGER, Appl. Phys. Lett. 66, 1325 (1995).
8. S. C. MINNE, H. T. SOH, P. FLUECKIGER, and C. F. QUATE, Appl. Phys. Lett. 66, 703 (1995).
9. PH. AVOURIS, R. E. WALKUP, A. R. ROSSI, H.C. AKPATI, P. NORDLANDER, T.-C. SHEN, G. C. ABELN, and J. W. LYDING, Surf. Sci. 363, 368 (1996).
10. K. STOKBRO, U. QUAADE, F. PEREZ-MURANO, C. THIRSTRUP, M. SAKURAI, M. AONO, and F. GREY, submitted for publication,
11. P. KRATZER, B. HAMMER, F. GREY, and J. K. NØRSKOV, Surf. Rev. Lett. 3, 1227 (1996).
12. J. BARDEEN, Phys. Rev. Lett. 6, 57 (1961). J. TERSOFF and D. R. HAMANN, Phys. Rev. B 31, 805 (1985).
13. J. BARDEEN, Phys. Rev. Lett. 6, 57 (1961). J. TERSOFF and D. R. HAMANN, Phys. Rev. B 31, 805 (1985).
14. J. DABROWSKI and M. SCHEFFLER, Appl. Surf. Sci. 56/58, 15 (1992).
15. P. NACHTIGALL, K. D. JORDAN, and C. SOSA, J. Chem. Phys. 101, 8073 (1994).
16. E. PEHLKE and M. SCHEFFLER, Phys. Rev. Lett. 74, 952 (1995).
17. P. KRATZER, B. HAMMER, and J. K. NØRSKOV, Phys. Rev. B. 51, 13432 (1995).
18. A. VITTADINI and A. SELLONI, Chem. Phys. Lett. 235, 334 (1995).
19. U. HÖFER, L. LI, and T. HEINZ, Phys. Rev. B 45, 9485 (1992).
20. N. D. LANG, Phys. Rev. B 49, 2067 (1994).
21. K. HIROSE and M. TSUKADA, Phys. Rev. Lett. 73, 150 (1994).
22. A. KOBAYASHI, F. GREY, R. S. WILLIAMS, and M. AONO, Science 259, 1724 (1993).
23. F. GREY, private communication.
24. J. D. JACKSON, Classical Electrodynamics, 2nd ed., Wiley & Sons, Inc., New York 1975 (p. 147).
25. M. SHUR, Physics of Semiconductor Devices, Prentice-Hall, Englewood Cliffs (N.J.) 1990 (p.332).
26. M. HIETSCHOLD, private communication.
27. R. E. WALKUP, D. M. NEWNS, and PH. AVOURIS, J. Electron Spectroscopy related Phenom. 64/65, 523 (1993).
28. J. C. TULLY, Y. J. CHABAL, K. RAGHAVACHARI, J. M. BOWMAN, and R. R. LUCCHESE, Phys. Rev. B 31, 1184 (1985).
29. P. GUYOT-SIONNEST, P. H. LIN, and E. M. HILLER, J. Chem. Phys. 102, 4269 (1995).
30. Y.J. CHABAL and K. RAGHAVACHARI, Phys. Rev. Lett. 53, 282 (1984).
31. B.N.J. PERSSON and J.E. DEMUTH, Solid State Comm. 57, 769 (1986).
32. J. KIRTLEY, in: Tunneling Spectroscopy, Ed. P. K. HANSMA, Plenum Press, New York 1982.