In situ reflectance difference spectroscopy of ZnSe-based semiconductor surfaces

Journal of Crystal Growth

Volumn 170, Issue 1-4, 1997, Pages 188-192

  Kastner, Marcus J ^a   Hahn, Berthold ^a   Blumberg, Roland ^a   Sossna, Eva ^a   Duschl, Rainer ^a   Gebhardt, Wolfgang ^a  

^a UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT REFLECTION; ORGANOMETALLICS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR GROWTH;

REFLECTANCE DIFFERENCE SPECTROSCOPY; ZINC SELENIDE;

METALLORGANIC VAPOR PHASE EPITAXY;

EID: 0030698482     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(96)00582-9     Document Type: Article

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