Scanning Electron Acoustic Microscopy

Advances in Electronics and Electron Physics

Volumn 71, Issue C, 1988, Pages 1-73

  Balk, Ludwig Josef ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007731596     PISSN: 00652539     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0065-2539(08)60900-2     Document Type: Article

References (61)

1. Alpern, P., Menzel, A., Tilgner, R., IEEE Trans. Ultrasonics Ferroelectrics, and Frequency Control, 1987 in press
2. Atherton, D.L., Szpunar, J.A., IEEE Trans. Magn., MAG-22, 1986, 514
3. Averkiev, N.S., Ilisavskiy, Y.V., Sternin, V.M., Solid State Commun., 52, 1984, 17
4. Balk, L.J., Can. J. Phys., 64, 1986, 1238
5. Balk, L.J., PhD Thesis, 1976, RWTH Aachen, F.R.G
6. Balk, L.J., Surface and Interface Analysis, 9, 1986, 47
7. Balk, L.J., Davies, D.G., Kultscher, N., IEEE Trans. Magn., MAG-20, 1984, 1466
8. Balk, L.J., Davies, D.G., Kultscher, N., J. Scanning Electron Microscopy, Part IV, 1984, 1601
9. Balk, L.J., Davies, D.G., Kultscher, N., Phys. Stat. Sol. (a), 82, 1984, 23
10. Balk, L.J., Kubalek, E., Beitr. elektronenmikroskop. Direktabb. Oberfl., BEDO-6, 1973, 551 (Verlag Remy, Münster, F.R.G.)
11. Balk, L.J., Kultscher, N., Beitr. elektronenmikroskop. Direktabb. Oberf., BEDO-16, 1983, 107 (Verlag Remy, Münster, F.R.G.)
12. Balk, L.J., Kultscher, N., Inst. Phys. Conf. Ser., 67, 1983, 387
13. Balk, L.J., Kultscher, N., J. de Physique Colloque, C2, 1984, 869
14. Balk, L.J., Menzel, E., Kubalek, E., IITRI Proc. Scanning Electron Microscopy, Part I, 1975, 447
15. Balk, L.J., Menzel, E., Kubalek, E., Proc. Int. Congr. X-ray Optics and Microanalysis, 8th, 1977, 1980, 613
16. Balk, L.J., Richard, G., Kultscher, N., Inst. Phys. Conf. Ser., 76, 1985, 343
17. Begnoche, B.C., Holstein, W.L., Proc. EMSA Meeting, 42, 1984, 390
18. Baumann, T., Dacol, F., Melcher, R.L., Appl. Phys. Lett., 43, 1983, 71
19. Brandis, E., Rosencwaig, A., Appl. Phys. Lett., 37, 1980, 98
20. Cargill, G.S. III, Proc. Ann. EMSA Meeting, 39, 1981, 390
21. Cargill, G.S. III, Ash, E.A., (eds.) “Scanned Image Microscopy”, 1980, Academic Press, New York., 319
22. Cazaux, J., J. Appl. Phys., 59, 1986, 1418
23. Coufal, H., Appl. Phys. Lett., 44, 1984, 59
24. Dacol, F.H., Ermert, H., Melcher, R.L., J. Scanning Electron Microscopy, Part II, 1985, 627
25. Davies, D.G., J. Scanning Electron Microscopy, Part III, 1983, 1163
26. Davies, D.G., PhD Thesis, 1985, University of Cambridge, U.K
27. Eberharter, G., Feuerbaum, H.P., Appl. Phys. Lett., 37, 1980, 698
28. Favro, L.D., Kuo, P.K., Lin, M.J., Inglehart, L.J., Thomas, R.L., Proc. IEEE Ultrasonics Symposium, 1984, 629
29. Favro, L.D., Kuo, P.K., Shepard, S.M., Thomas, R.L., Proc. IEEE Ultrasonics Symposium 1986, 1987 in press
30. Ferrieu, F., Auvert, G., J. Appl. Phys., 54, 1983, 2646
31. Fournier, D., Boccara, C., Skumanich, A., Amer, N.M., J. Appl. Phys., 59, 1986, 787
32. Hildebrand, J.A., J. Acoust Soc. Am., 79, 1986, 1457
33. Holstein, W.L., J. Appl. Phys., 58, 1985, 2008
34. Huebener, R.P., Metzger, W., J. Scanning Electron Microscopy, Part II, 1985, 617
35. Ikoma, T., Murayama, M., Morizuka, K., Japan. J. Appl. Phys., 23(Suppl. 23–1), 1984, 194
36. Kirkendall, T.D., Remmel, T.P., J. de Physique Colloque, C2, 1984, 877
37. Koirakh, L.A., Preobrazhncskii, V.L., Sov. Phys. Acoust., 30, 1984, 134
38. Kultscher, N., Balk, L.J., J. Scanning Electron Microscopy, Part I, 1986, 33
39. Menzel, E., Kubalek, E., J. Scanning Electron Microscopy, Part I, 1979, 305
40. Morizuka, K., Adachi, Y., Ikoma, T., Japan. J. Appl. Phys., 21(Suppl. 21–1), 1982, 449
41. Murphy, J.C., Maclachlan, J.W., Aamodt, L.C., IEEE Trans. Ultrasonics Ferroelectrics, and Frequency Control, 1987 in press
42. Opsal, J., Rosencwaig, A., J. Appl. Phys., 52, 1982, 4240
43. Proctor, T.M. Jr., J. Acoust. Soc. Am., 71, 1982, 1163
44. Reimer, L., J. Scanning Electron Microscopy, Part II, 1979, 111
45. Ringermacher, H.I., Jackman, L., Thompson, D.O., Chimenti, D.E., (eds.) “Review of progress in quantitative nondestructive evaluation”, 5, 1986, Plenum Press, New York., 567
46. Rosencwaig, A., J Scanning Electron Microscopy, Part IV, 1984, 1611
47. Rosencwaig, A., Gersho, A., J. Appl. Phys., 47, 1976, 64
48. Sablikov, V.A., Sandomirskii, V.B., Sov. Phys. Semicond., 17, 1983, 50
49. Sasaki, M., Negishi, H., Inoue, M., J. Appl. Phys., 59, 1986, 796
50. Shimizu, R., Ikuta, T., Everhart, T.E., DeVore, W.J., J. Appl. Phys., 46, 1975, 1581
51. Sieger, G.E., Lefevre, H.W., Phys. Rev. A, 31, 1985, 3929
52. Stearns, R.G., Kino, G.S., Appl. Phys. Lett., 47, 1985, 1048
53. Takenoshita, H., Solar Cells, 16, 1986, 65
54. Takenoshita, H., Kawamura, T., Proc. Int. Congr. Electron Microscopy, 11th, 1986, 1986, 387
55. Takenoshita, H., Managaki, M., Mizuno, K., Japan. J. Appl. Phys., 24(Suppl. 24–1), 1985, 93
56. Tarn, A.C., Review of Modern Physics, 58, 1986, 381
57. Tronconi, A.L., Amato, M.A., Morais, P.C., Skeff Neto, K., J. Appl. Phys., 56, 1984, 1462
58. Veith, G., Appl. Phys. Lett., 41, 1982, 1045
59. Yamanouchi, K., Kudo, S., Wagatsuma, Y., Japan. J. Appl. Phys., 23(Suppl. 23–1), 1984, 191
60. Yamada, M., Nambu, K., Yamamoto, K., J. Appl. Phys., 57, 1985, 965
61. Yonenaga, I., Sumino, K., J. Appl. Phys., 56, 1984, 2346