High-resolution X-ray diffraction analysis of magnetically aligned high-Tc superconducting ceramics

Physica C: Superconductivity and its Applications

Volumn 265, Issue 3-4, 1996, Pages 233-242

  Chrosch, J ^a   Panagopoulos, C ^a   Athanassopoulou, N ^a   Cooper, J R ^a   Salje, E K H ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; CRYSTALLOGRAPHY; GONIOMETERS; INTEGRATION; MAGNETIZATION; X RAY DIFFRACTION ANALYSIS; X RAYS;

BOND CAMERA; DEGREE OF ALIGNMENT; GRAZING INCIDENCE SURFACE DIFFRACTOMETER; SUPERCONDUCTING CERAMICS; X RAY BEAMS;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0030182133     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4534(96)00292-4     Document Type: Article

References (10)

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2. D.B. Knorr and J.D. Livingston, Supercond. Sci. Technol. 1 (1989) 302.
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4. E.K.H. Salje, Phase Transitions 55 (1995) 37-56.
5. J. Chrosch and E.K.H. Salje, Ferroelectrics (1996), in press.
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8. E.K.H. Salje and J. Chrosch, Ferroelectrics (1996), in press.
9. K.R. Locherer, S.A. Hayward, J. Chrosch and E.K.H. Salje (1996), submitted to the Royal Society, London.
10. G.A. Wagner, J. Chrosch and P. Berhuis, in preparation.