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Volumn 120, Issue 1-4, 1996, Pages 282-285
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Investigation of plasma immersion ion implanted niobium oxide and titanium nitride films by nanohardness measurement
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Author keywords
[No Author keywords available]
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Indexed keywords
HARDNESS;
NIOBIUM COMPOUNDS;
PLASMA APPLICATIONS;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SURFACE TREATMENT;
THIN FILMS;
TITANIUM NITRIDE;
X RAY DIFFRACTION ANALYSIS;
PLASMA IMMERSION ION IMPLANTATION;
ION IMPLANTATION;
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EID: 0030566610
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(96)00527-7 Document Type: Article |
Times cited : (5)
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References (12)
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