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Volumn 169, Issue 4, 1996, Pages 764-772

Growth of (FexMg1-x)2SiO4 single crystals by the double pass floating zone method

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; COMPOSITION; CRYSTAL DEFECTS; CRYSTAL GROWTH; ELECTRON MICROSCOPY; INTERFACES (MATERIALS); IRON OXIDES; SILICA; SINGLE CRYSTALS; THERMAL GRADIENTS;

EID: 0030566438     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(96)00461-7     Document Type: Article
Times cited : (7)

References (18)
  • 1
    • 0012561868 scopus 로고
    • Eds. G.-A. Nazri, J.-M. Tarascon and M. Schreiber MRS, Pittsburgh, PA
    • T.-L. Tsai and R. Dieckmann, in: Solid State Ionics IV, MRS Proc., Eds. G.-A. Nazri, J.-M. Tarascon and M. Schreiber (MRS, Pittsburgh, PA, 1995) p. 313.
    • (1995) Solid State Ionics IV, MRS Proc. , pp. 313
    • Tsai, T.-L.1    Dieckmann, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.