Characterization and utilization of the context-dependent physical properties of nanoparticles for nanostructures investigated by scanning tunnelling microscopy

Applied Surface Science

Volumn 107, Issue , 1996, Pages 197-202

  Hartmann, E ^a   Marquardt, P ^b   Ditterich, J ^b   Radojkovic, P ^a   Steinberger, H ^b  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b Fraunhofer Inst F   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONDENSATION; CURRENT VOLTAGE CHARACTERISTICS; EVAPORATION; PARTICLES (PARTICULATE MATTER); PHYSICAL PROPERTIES; SCANNING TUNNELING MICROSCOPY; SUBSTRATES;

ATOMICALLY FLAT SUBSTRATES; CONTEXT DEPENDENT OBJECTS;

NANOSTRUCTURED MATERIALS;

EID: 0030566198     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00507-7     Document Type: Article

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