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Volumn 51, Issue 9, 1995, Pages 5617-5627
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Determination of the static scaling exponent of self-affine interfaces by nonspecular x-ray scattering
a
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000643716
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevB.51.5617 Document Type: Article |
Times cited : (82)
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References (23)
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