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Volumn 51, Issue 9, 1995, Pages 5617-5627

Determination of the static scaling exponent of self-affine interfaces by nonspecular x-ray scattering

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000643716     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.51.5617     Document Type: Article
Times cited : (82)

References (23)
  • 10
    • 0001066994 scopus 로고
    • Roughness spectrum and surface width of self-affine fractal surfaces via the K-correlation model
    • (1993) Physical Review B , vol.48 , pp. 14472
    • Palasantzas, G.1
  • 12
    • 84931555970 scopus 로고    scopus 로고
    • W. Weber, Ph.D. thesis RWTH Aachen, 1992.
  • 17
    • 84931555964 scopus 로고    scopus 로고
    • H. Dosch, Critical Phenomena at Surfaces and Interfaces, Springer Tracts in Modern Physics Vol. 126B (Springer, Berlin, 1992).
  • 18
    • 84931555965 scopus 로고    scopus 로고
    • P. Dhez and C. Weisbuch, Physics, Fabrication, and Applications of Multilayered Structures, Vol. 182 of NATO Advanced Study Institute, Series B: Physics (Plenum, New York, 1988).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.