In-situ reflectivity measurements during pulsed-laser deposition of Bi 2 Sr 2 CaCu 2 O 8+δ

Applied Surface Science

Volumn 96-98, Issue , 1996, Pages 721-725

  Ritzer, Alfons ^a   Falkner, B ^a   Li, S T ^a   Bauerle D ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

Bi 2 Sr 2 CaCu 2 O 8+ ; High temperature superconductivity; Pulsed laser deposition; Reflectivity; Thin films

Indexed keywords

PULSED LASER DEPOSITION; REFLECTIVITY; REPETITION RATE; STOICHIOMETRIC CERAMIC TARGET; TEMPORAL EVOLUTION;

BISMUTH COMPOUNDS; DEPOSITION; FILM GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; LASER PULSES; LATTICE CONSTANTS; MORPHOLOGY; REFLECTOMETERS; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; SURFACES; X RAY DIFFRACTION;

METALLIC FILMS;

EID: 0030562968     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(95)00574-9     Document Type: Article

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