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Volumn 290-291, Issue , 1996, Pages 112-119

Plasma diagnostic studies to the carbon nitride film deposition by reactive r.f. Magnetron sputtering

Author keywords

Carbon nitride; Plasma processing and deposition; Sputtering

Indexed keywords

CARBON INORGANIC COMPOUNDS; CHEMICAL BONDS; DESORPTION; ELECTRON ENERGY LEVELS; FILM GROWTH; ION BOMBARDMENT; MAGNETRON SPUTTERING; MASS SPECTROMETRY; PLASMA DIAGNOSTICS; RESIDUAL STRESSES; SPUTTER DEPOSITION;

EID: 0030415483     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09199-7     Document Type: Article
Times cited : (88)

References (50)
  • 47
    • 0006339940 scopus 로고
    • American Chemical Soc., Washington, DC
    • M.M. Shahim, Advances in Chemistry Series, No 80, American Chemical Soc., Washington, DC, 1966, p. 315.
    • (1966) Advances in Chemistry Series , Issue.80 , pp. 315
    • Shahim, M.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.