Study of polytype phase transition β to α SiC by qualitative and quantitative analysis of stacking disorder by X-ray diffraction and structure modelling

Materials Science Forum

Volumn 228-231, Issue PART 2, 1996, Pages 663-668

  Stel'makh, S ^a   Palosz, B ^a   Gierlotka, S ^a  

^a INSTITUTE OF HIGH PRESSURE PHYSICS   (Poland)

Author keywords

Disorder; Modelling; Polytypism; Powder Diffraction; Rietveld Method

Indexed keywords

COMPUTER SIMULATION; CRYSTAL STRUCTURE; MATHEMATICAL MODELS; PHASE TRANSITIONS; POLYCRYSTALLINE MATERIALS; STACKING FAULTS; STRUCTURAL ANALYSIS; SUPERCONDUCTING TRANSITION TEMPERATURE; X RAY POWDER DIFFRACTION;

POLYTYPE PHASE TRANSITION; QUALITATIVE ANALYSIS; QUANTITATIVE ANALYSIS; SELF PROPAGATING HIGH TEMPERATURE SYNTHESIS;

SILICON CARBIDE;

EID: 0030401801     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.228-231.663     Document Type: Article

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