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Volumn 383, Issue 1, 1996, Pages 205-210
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ATLAS beam test results
a a b b b b b b b c c c c c c c d d d d more..
d
CERN
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
DATA ACQUISITION;
MICROSTRIP DEVICES;
PARTICLE BEAM TRACKING;
READOUT SYSTEMS;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DEVICE TESTING;
SIGNAL TO NOISE RATIO;
SILICON SENSORS;
SEMICONDUCTOR TRACKERS;
PARTICLE DETECTORS;
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EID: 0030386329
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(96)00669-9 Document Type: Article |
Times cited : (5)
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References (16)
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