SCOPUS 정보 검색 플랫폼

Volumn 82, Issue 3, 1996, Pages 173-178

Characteristic depth of the excitation function for Auger electrons in the noble metals Cu, Ag and Au determined by inelastic background analysis

Author keywords

Auger electron spectroscopy; Characteristic depth; Photoelectron spectroscopy; Tougaard method

Indexed keywords

COPPER; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRONS; GOLD; SILVER; X RAY PHOTOELECTRON SPECTROSCOPY;

AUGER ELECTRONS; CHARACTERISTIC DEPTH; INELASTIC BACKGROUND ANALYSIS; NOBLE METALS; TOUGAARD METHOD; X RAY EXCITED AUGER ELECTRON SPECTROSCOPY;

AUGER ELECTRON SPECTROSCOPY;

EID: 0030378188 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/S0368-2048(96)03064-2 Document Type: Article

Times cited : (7)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.