Comparison of the Josephson voltage standards of the NIM (China) and the BIPM

Metrologia

Volumn 33, Issue 5, 1996, Pages 475-478

  Reymann, D ^a   Xue, S Q ^b   Liu, R M ^b   Li, H H ^b   Gao, J ^c   Zhou, Y Q ^c   Witt, T J ^a  

^a PAVILLON DE BRETEUIL   (France)

^b NATIONAL INSTITUTE OF METROLOGY   (China)

^c National Institute of Measurement and Testing Technology   (China)

Author keywords

[No Author keywords available]

Indexed keywords

JOSEPHSON VOLTAGE STANDARDS;

CALIBRATION; JOSEPHSON JUNCTION DEVICES; MEASUREMENT ERRORS; METRIC SYSTEM; STANDARDS;

VOLTAGE MEASUREMENT;

EID: 0030361115     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/33/5/6     Document Type: Review

References (4)

1. Reymann D., Kim K.-T., Christian L. A., Frenkel R. B., Witt T. J., Comparisons of the Josephson voltage standard of the BIPM with those of the KRISS, the MSL and the NML, Metrologia, 1996, 33, 75-79.
2. Yoshida H., Sakamoto Y., Endo T., Circuit Precautions for Stable Operation of Josephson Junction Array Voltage Standard. IEEE Trans. Instrum. Meas., 1991, 40, 303-308.
3. Reymann D., A Practical Device for 1-nV Accuracy Measurements with Josephson Arrays. IEEE Trans. Instrum. Meas., 1991, 40, 309-311.
4. Xue S. Q. et al., I-V and 10-V Josephson Junction Array Voltage Standard at NIM. CPEM Conference Digest, 1994, 97-98.