Comparisons of the Josephson voltage standard of the BIPM with those of the KRISS, the MSL and the NML

Metrologia

Volumn 33, Issue 1, 1996, Pages 75-79

  Reymann, D ^a   Kim, K T ^b   Christian, L A ^c   Frenkel, R B ^d   Witt, T J ^a  

^a PAVILLON DE BRETEUIL   (France)

^b Korea Research Institute of Standards and Science   (South Korea)

^c CALLAGHAN INNOVATION   (New Zealand)

^d CSIRO   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

BUREAU INTERNATIONAL DES POIDS ET MESURES (BIPM); JOSEPHSON ARRAY VOLTAGE STANDARD (JAVS); KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE (KRISS); MEASUREMENT STANDARDS LABORATORY (MSL); NATIONAL MEASUREMENT LABORATORY (NML);

COMPUTER SIMULATION; DATA ACQUISITION; DATA REDUCTION; STANDARDS;

VOLTAGE MEASUREMENT;

EID: 0029719633     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/33/1/10     Document Type: Review

References (13)

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3. Yoshida H., Sakamoto Y., Endo T., Circuit Precautions for Stable Operation of Josephson Junction Array Voltage Standard, IEEE Trans. Instrum. Meas., 1991, 40, 305-308.
4. Kim K.-T., Park S. I., Cho Y. M., Lee R. D., Maintenance of the KRISS Voltage Standard by the Josephson Effect, The 4th ROK-ROC Metrology Symposium, 19-21 May 1992, Taejon, Korea Research Institute of Standards and Science.
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9. Harvey I. K., National Measurement Laboratory, CSIRO, unpublished report.
10. Frenkel R. B., In Modern Techniques in Metrology (Edited by Paul L. Hewitt), World Scientific Publishing Co., 1984.
11. Reymann D., A Practical Device for 1-nV Accuracy Measurements with Josephson Arrays, IEEE Trans. Instrum. Meas., 1991, 40, 309-311.
12. Taylor B. N., Parker W. H., Langenberg D. N., Determination of e/h, QED, and Fundamental Constants, Rev. Mod. Phys., 1969, 41, 375-496.
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