Size effects in small oxide confined vertical-cavity surface-emitting lasers

Applied Physics Letters

Volumn 69, Issue 21, 1996, Pages 3152-3154

  Oh, T H ^a   Huffaker, D L ^a   Deppe, D G ^a  

^a The University of Texas at Austin   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; EFFICIENCY; LIGHT EMISSION; MIRRORS; MOLECULAR BEAM EPITAXY; OXIDATION; OXIDES; QUANTUM EFFICIENCY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS;

DISTRIBUTED BRAGG REFLECTOR; FAR FIELD RADIATION PATTERNS; NONRADIATIVE RECOMBINATION; OPTICAL LOSS; OXIDE CONFINEMENT; SPONTANEOUS EMISSION; VERTICAL CAVITY SURFACE EMITTING LASERS;

SEMICONDUCTOR LASERS;

EID: 0030289420     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116812     Document Type: Article

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