Nanoscopic trigonal pyramidal crystallites in WS2-x sputtered thin films: A scanning tunnelling microscopy study of initial growth

Surface Science

Volumn 366, Issue 2, 1996, Pages

  Ballif, C ^a   Regula, M ^a   Remskar M ^a,b   Sanjines R ^a   Levy F ^a  

^a EPFL   (Switzerland)

^b JO EF STEFAN INSTITUTE   (Slovenia)

Author keywords

Growth; Scanning tunnelling microscopy; Sputter deposition; Surface topography; Tungsten sulphide

Indexed keywords

CRYSTAL GROWTH; FILM GROWTH; FILM PREPARATION; MAGNETRON SPUTTERING; SCANNING TUNNELING MICROSCOPY; SPUTTER DEPOSITION; THIN FILMS; TUNGSTEN COMPOUNDS;

NANOSCOPIC TRIGONAL PYRAMIDAL CRYSTALLITES; SURFACE TOPOGRAPHY; TUNGSTEN SULPHIDE;

CRYSTALLINE MATERIALS;

EID: 0030258654     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00933-8     Document Type: Article

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