A look at the phenomenon of charge multiplication in silicon radiation detector within the concept of dynamic focusing of the electric field

IEEE Transactions on Nuclear Science

Volumn 43, Issue 5, 1996, Pages 2496-2500

  Tsyganov, Yu ^a   Kushniruk, W ^a   Polyakov, A ^a  

^a JOINT INSTITUTE FOR NUCLEAR RESEARCH   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC FIELDS; ELECTRONS; HOT CARRIERS; IONIZATION; IONS;

ELECTRON HOLE CONCENTRATION; SILICON RADIATION DETECTORS;

RADIATION DETECTORS;

EID: 0030257911     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.539398     Document Type: Article

References (11)

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