Interlayer coupling in spin valve structures

IEEE Transactions on Magnetics

Volumn 32, Issue 5 PART 2, 1996, Pages 4642-4644

  Leal, J L ^a   Kryder, M H ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FERMI SURFACE; FERROMAGNETIC MATERIALS; INTERFACES (MATERIALS); MAGNETIC FIELDS; MAGNETIC VARIABLES MEASUREMENT; MAGNETIZATION; MAGNETORESISTANCE; OSCILLATIONS; STRAIN; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

INTERLAYERS COUPLING; MEAN ROUGHNESS; NEEL ORANGE PEEL COUPLING; SPIN VALVE STRUCTURES; X RAY DIFFRACTOMETERS;

MAGNETIC FIELD EFFECTS;

EID: 0030246724     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.539104     Document Type: Article

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