Submicron trackwidth and stripe height MR sensor test structures

IEEE Transactions on Magnetics

Volumn 32, Issue 5 PART 1, 1996, Pages 3440-3442

  Fontana, Robert E ^a   MacDonald, Scott A ^a   Tsang, Ching ^a   Lin Tsann, ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FABRICATION; LITHOGRAPHY; MAGNETIC FILMS; MAGNETIC HEADS; MAGNETIC RECORDING; MAGNETIC SHIELDING; MAGNETORESISTANCE;

CONTIGUOUS JUNCTION SENSOR; CRITICAL DIMENSIONS; LONGITUDINAL BIAS SCHEMES; MAGNETORESISTIVE SENSORS; STABLE TRANSFER CURVES; STRIPE HEIGHT; SUBMICRON TRACKWIDTH;

SENSORS;

EID: 0030246286     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.538650     Document Type: Article

References (9)

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