Consequences of Ti-, Li-, and Er-ion implantations on the optical properties of single layers of Ta2O5

Applied Optics

Volumn 35, Issue 25, 1996, Pages 5085-5090

  Flory, F ^a   Berthier, D ^a   Rigneault, H ^a   Roux, L ^b  

^a CNRS   (France)

^b Ion Beam Service   (France)

Author keywords

Guided waves; Ion implantation; Luminescence; Optical properties; Thin films

Indexed keywords

CALCULATIONS; ERBIUM; GUIDED ELECTROMAGNETIC WAVE PROPAGATION; ION IMPLANTATION; LITHIUM; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; REFRACTIVE INDEX; SECONDARY ION MASS SPECTROMETRY; SPECTROPHOTOMETRY; TANTALUM COMPOUNDS; TITANIUM;

FILM THICKNESS; ION PLATING; PHOTOTHERMAL DEFLECTION; TANTALUM PENTOXIDE;

THIN FILMS;

EID: 0030242575     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.005085     Document Type: Article

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