Theoretical analysis of Si and O xanes spectra of zircon vs alpha-quartz

Solid State Communications

Volumn 99, Issue 11, 1996, Pages 773-778

  Wu, Ziyu ^a,b   Seifert, Friedrich ^c  

^a INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

^b INFN LABORATORI NAZIONALI DI FRASCATI   (Italy)

^c UNIVERSITÄT BAYREUTH   (Germany)

Author keywords

C. EXAFS; E. electron energy loss spectroscopy; E. X ray and ray spectroscopies; NEXAFS; SEXAFS

Indexed keywords

CALCULATIONS; ELECTRON ENERGY LOSS SPECTROSCOPY; GAMMA RAY SPECTROMETERS; QUARTZ; SCATTERING; X RAY SPECTROSCOPY;

ALPHA QUARTZ; MULTIPLE SCATTERING; X RAY ABSORPTION NEAR EDGE STRUCTURE;

ZIRCON;

EID: 0030241027     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1098(96)00331-6     Document Type: Article

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