Integrated test support for intelligent sensors

IEE Colloquium (Digest)

Volumn , Issue 261, 1996, Pages

  Olbrich, T ^a   Richardson, A ^a  

^a LANCASTER UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; APPLICATION SPECIFIC INTEGRATED CIRCUITS; COST EFFECTIVENESS; DISTRIBUTED COMPUTER SYSTEMS; FAILURE ANALYSIS; MULTICHIP MODULES; ONLINE SYSTEMS; RELIABILITY;

BUILT IN SELF TEST (BIST); DESIGN FOR TEST (DFT) CONCEPT; INTELLIGENT SENSORS; ONLINE MONITORING FUNCTIONS; RELIABILITY INDICATORS (RI);

SENSORS;

EID: 0030223710     PISSN: 09633308     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (16)

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2. Th. Olbrich, D.A. Bradley, A.M.D. Richardson "BIST for Microsystems as a Contributor to System Quality and Performance", Journal of Quality Engineering, Special issue on Quality Effort in Europe" vol 8, no. 4 pp 601-613, 1996.
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8. Olbrich T, Richardson A M D & Bradley D, "Buit-in-Self-Test and Diagnostics for safety Critical Microsystems" Microelectron. Reliability, Vol. 36, Ni 7/8, pp. 1125-1136, 1996.
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12. Thomas Olbrich Andrew Richardson Wolfgang Vermeiren & Bernd Sträube "Integrated Test Support for Micro-Electro-Mechanical-Systems (MEMS)", MEMS 96, 17th - 19th Sept 1996, Berlin, Germany.
13. Yick P, White N M and Brignell J E, "A reconfigurable ASIC front end", IEE colloquium on "Application Specific Integrated Circuits for Measurement Systems", 24th Feb 1994, London.
14. Andrew Richardson, Thomas Olbrich, Valentino Liberals & Franco Maloberti, "Design-for-Test Strategies for Analogue & Mixed Signal Integrated Circuits, 38th Mid West Symposium, Rio-de-Janerio, Brazil, August 1995.
15. Mir S, Kolarik V, Lubaszewski M, Nielsen C & Courtois B, "Built-in-Slf-Test and Fault Diagnosis of Fully Differential Analogue Circuits, ICCAD 94, Proc. Int. Conf. On Computer Aided Design, San Jose, CA, USA, Nov 1994, pp.486-490.
16. Thomas Olbrich & Andrew Richardson, "Built-in self-test for High Performance Switched Current Designs", IEEE Design & Test of Computers, Vol 13, No 2, pp10-18, 1996.