Chromium implantation in silica glass

Journal of Materials Research

Volumn 11, Issue 1, 1996, Pages 229-235

  Cattaruzza, E ^a,b   Bertoncello, R ^a   Trivillin, F ^a   Mazzoldi, P ^b   Battaglin, G ^c   Mirenghi, L ^d   Rotolo, P ^d  

^a UNIVERSITY OF PADOVA   (Italy)

^b Temporary Address: Dipartimento di Fisica   (Italy)

^c Dipto di Chim Fis dell'Universita   (Italy)

^d Centro Nazionale per la Ricerca e lo Sviluppo dei Materiali   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CARBON; CHROMIUM; CHROMIUM COMPOUNDS; GIBBS FREE ENERGY; ION IMPLANTATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; THERMODYNAMICS; X RAY PHOTOELECTRON SPECTROSCOPY;

CHROMIUM CARBIDE; CHROMIUM OXIDE; CHROMIUM SILICIDE; X RAY EXCITED AUGER ELECTRON SPECTROSCOPY;

FUSED SILICA;

EID: 0029752662     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1996.0028     Document Type: Article

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