Future of imaging technology

Sensors and Actuators, A: Physical

Volumn 56, Issue 1-2, 1996, Pages 31-38

  Ai, Mitsuo ^a  

^a AI Sensor Engineering Laboratory   (Japan)

Author keywords

Computed tomography; Electron holography; Electron microscopy; Imaging; Imaging technology; Inverse problem; Microscopy; Pattern recognition; Sensors; Tomography

Indexed keywords

COMPUTERIZED TOMOGRAPHY; IMAGE SENSORS; INVERSE PROBLEMS; LSI CIRCUITS; MICROMACHINING; PATTERN RECOGNITION; SCANNING ELECTRON MICROSCOPY;

MICROSCOPIC IMAGING IMAGES; TOMOGRAPHIC IMAGING;

IMAGING SYSTEMS;

EID: 0030206051     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/0924-4247(96)01306-4     Document Type: Article

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