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Volumn 11, Issue 8, 1996, Pages 1218-1224
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Comparison of BCl3/Ar and BCl3/N2 plasma chemistries for dry etching of InGaAlP alloys
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Author keywords
[No Author keywords available]
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Indexed keywords
DRY ETCHING;
ELECTRON CYCLOTRON RESONANCE;
MORPHOLOGY;
PLASMA ETCHING;
SEMICONDUCTING ALUMINUM COMPOUNDS;
ETCH RATES;
SELVEDGE LAYERS;
SEMICONDUCTING INDIUM COMPOUNDS;
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EID: 0030205434
PISSN: 02681242
EISSN: None
Source Type: Journal
DOI: 10.1088/0268-1242/11/8/018 Document Type: Review |
Times cited : (4)
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References (23)
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