Study on stacking faults and microtwins in wide bandgap II-VI semiconductor heterostructures grown on GaAs

Journal of Electronic Materials

Volumn 25, Issue 2, 1996, Pages 263-267

  Hua, G C ^a,c   Grillo, D C ^a   Ng, T B ^a   Chu, C C ^a   Han, J ^a   Gunshor, R L ^a   Nurmikko, A V ^b  

^a PURDUE UNIVERSITY   (United States)

^b BROWN UNIVERSITY   (United States)

^c Siltec Silicon Corporation   (United States)

Author keywords

Microtwins; Stacking faults; Transmission electron microscopy (TEM)

Indexed keywords

EID: 0002584976     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02666255     Document Type: Article

References (8)

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