FsmTest: Functional test generation for sequential circuits

Integration, the VLSI Journal

Volumn 20, Issue 3, 1996, Pages 303-325

  Buonanno, G ^a   Fummi, F ^a   Sciuto, D ^a   Lombardi, F ^b  

^a POLITECNICO DI MILANO   (Italy)

^b TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Distinguishing sequences; Functional testing; Test pattern generation

Indexed keywords

ALGORITHMS; CONTROL SYSTEM SYNTHESIS; FINITE AUTOMATA; INTEGRATED CIRCUIT TESTING; LOGIC GATES; MATHEMATICAL MODELS;

FINITE STATE MACHINE; FUNCTIONAL TESTING; TEST PATTERN GENERATION;

SEQUENTIAL CIRCUITS;

EID: 0030193964     PISSN: 01679260     EISSN: None     Source Type: Journal    
DOI: 10.1016/0167-9260(96)00006-5     Document Type: Article

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