Functional test generation for finite state machines

Digest of Papers - International Test Conference

Volumn , Issue , 1990, Pages 162-168

  Cheng, Kwang Ting ^a   Jou, Jing Yang ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS;

FAULT COLLAPSING TECHNIQUE; FAULT MODELS; FINITE STATE MACHINES; FUNCTIONAL FAULT MODELS; FUNCTIONAL TEST GENERATION METHODS; SINGLE TRANSITION FAULT MODELS;

COMPUTERS;

EID: 0025480160     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)