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Volumn 50, Issue 4, 1996, Pages 427-435

Atmospheric-pressure helium inductively coupled plasmas for elemental mass spectrometry

Author keywords

Elemental analysis; Helium inductively coupled plasma; Ion kinetic energy; Mass spectrometry; Secondary discharge

Indexed keywords

CHEMICAL ELEMENTS; ELECTRIC DISCHARGES; METALS; PLASMAS;

EID: 0030113949     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702963906140     Document Type: Article
Times cited : (30)

References (53)
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    • and references therein, A. Montaser and D. W. Golightly, Eds. VCH, New York, 2nd ed.
    • G. Horlick and Y. Shao, "Inductively Coupled Plasma-Mass Spectrometry for Elemental Analysis" and references therein, in Inductively Coupled Plasmas in Analytical Atomic Spectrometry, A. Montaser and D. W. Golightly, Eds. (VCH, New York, 1992), 2nd ed.
    • (1992) Inductively Coupled Plasmas in Analytical Atomic Spectrometry
    • Horlick, G.1    Shao, Y.2
  • 13
    • 0042692806 scopus 로고
    • Inductively Coupled Plasmas in Gases Other Than Argon
    • and references therein, A. Montaser and D. W. Golightly, Eds. VCH, New York, 2nd ed.
    • H.A. Montaser, K. D. Ohls, and D. W. Golightly, "Inductively Coupled Plasmas in Gases Other Than Argon" and references therein, in Inductively Coupled Plasmas in Analytical Atomic Spectrometry, A. Montaser and D. W. Golightly, Eds. (VCH, New York, 1992), 2nd ed.
    • (1992) Inductively Coupled Plasmas in Analytical Atomic Spectrometry
    • Montaser, H.A.1    Ohls, K.D.2    Golightly, D.W.3
  • 25
    • 85033023137 scopus 로고    scopus 로고
    • A Status Report on Helium Inductively Coupled Plasma Mass Spectrometry
    • accepted for publication
    • S. Nam, H. Zhang, M. Cai, J. Lim, and A. Montaser, "A Status Report on Helium Inductively Coupled Plasma Mass Spectrometry", Fresenius' J. Anal. Chem, accepted for publication.
    • Fresenius' J. Anal. Chem
    • Nam, S.1    Zhang, H.2    Cai, M.3    Lim, J.4    Montaser, A.5
  • 31
    • 8644272284 scopus 로고
    • Applications of Plasma Source Mass Spectrometry II
    • (a) S. D. Tanner, Spec. Publ.-R. Soc. Chem, 124 (Applications of Plasma Source Mass Spectrometry II), 222 (1993)
    • (1993) Spec. Publ.-R. Soc. Chem , vol.124 , pp. 222
    • Tanner, S.D.1
  • 32
    • 85033002802 scopus 로고
    • private communication October 3
    • (b) S. D. Tanner, private communication (October 3, 1995).
    • (1995)
    • Tanner, S.D.1
  • 33
    • 0002482452 scopus 로고
    • Fundamental Aspects of Inductively Coupled Plasma-Mass Spectrometry
    • and references therein, A. Montaser and D. W. Golightly, Eds. VCH, New York, 2nd ed.
    • D. J. Douglas, "Fundamental Aspects of Inductively Coupled Plasma-Mass Spectrometry" and references therein, in Inductively Coupled Plasmas in Analytical Atomic Spectrometry, A. Montaser and D. W. Golightly, Eds. (VCH, New York, 1992), 2nd ed.
    • (1992) Inductively Coupled Plasmas in Analytical Atomic Spectrometry
    • Douglas, D.J.1
  • 42
    • 0003516749 scopus 로고
    • W.H. Freeman and Company, New York, 4th ed.
    • P. W. Atkins, Physical Chemistry (W.H. Freeman and Company, New York, 1990), 4th ed., pp. 730-732.
    • (1990) Physical Chemistry , pp. 730-732
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  • 53
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    • U.S. Patent Number 4804838 (1988)
    • K. Miseki, U.S. Patent Number 4804838 (1988).
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.