Critical point analysis of the interband transition strength of electrons

Journal of Physics D: Applied Physics

Volumn 29, Issue 7, 1996, Pages 1740-1750

  Loughin, S ^a   French, R H ^b   De Noyer, L K ^c   Ching, W Y ^d   Xu, Y N ^d  

^a LOCKHEED MARTIN   (United States)

^b DUPONT COMPANY   (United States)

^c Spectrum Square Associates ^*  (United States)

^d UNIVERSITY OF MISSOURI KANSAS CITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; ELECTRONIC DENSITY OF STATES; ELECTRONS; MATHEMATICAL MODELS; NITRIDES;

ALUMINUM NITRIDE; CONDUCTION BAND; CRITICAL POINT ANALYSIS; INTERBAND TRANSITION STRENGTH; VALENCE BAND;

ELECTRON TRANSITIONS;

EID: 0030196614     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/29/7/009     Document Type: Article

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