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Volumn 360, Issue 1-3, 1996, Pages 200-212

Simulated reaction dynamics of F atoms on partially fluorinated Si(100) surfaces

Author keywords

Atom solid interactions; Fluorine; Low index single crystal surfaces; Models of surface chemical reactions; Molecular dynamics; Silicon; Single crystal surfaces; Solid gas interfaces; Surface chemical reactions

Indexed keywords

FLUORINE; MATHEMATICAL MODELS; MOLECULAR DYNAMICS; PHASE INTERFACES; REACTION KINETICS; SINGLE CRYSTALS; SURFACE TREATMENT;

EID: 0030189683     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00620-6     Document Type: Article
Times cited : (9)

References (34)
  • 6
    • 0042671970 scopus 로고    scopus 로고
    • personal communication
    • (b) J.R. Engstrom, personal communication.
    • Engstrom, J.R.1
  • 29
    • 0042170867 scopus 로고    scopus 로고
    • personal communication
    • S.T. Ceyer and co-workers, personal communication.
    • Ceyer, S.T.1
  • 32
    • 0041670150 scopus 로고    scopus 로고
    • to be published, as referenced in Ref. [30] by Yu and Delouise
    • Y.L. Li, J.J. Yang and S.T. Ceyer, to be published, as referenced in Ref. [30] by Yu and Delouise.
    • Li, Y.L.1    Yang, J.J.2    Ceyer, S.T.3
  • 33
    • 0042671967 scopus 로고
    • For a review of molecular beam studies on semiconductor surfaces, see M. Yu and L.A. DeLouise, Surf. Sci. Rep. 19 (1994) 289.
    • (1994) Surf. Sci. Rep. , vol.19 , pp. 289
    • Yu, M.1    DeLouise, L.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.