A method for vertex recognition in an automated vision system

Applied Mathematical Modelling

Volumn 20, Issue 6, 1996, Pages 412-420

  Klein, C M ^a   Hsiu, L R ^a  

^a University of Missouri   (United States)

Author keywords

Enhanced strip algorithm; Partial data elimination; Piecewise linear approximation; Scan along algorithm

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; COMPUTER AIDED MANUFACTURING; DIGITAL IMAGE STORAGE; DIGITAL SIGNAL PROCESSING; INSPECTION; PATTERN RECOGNITION; PIECEWISE LINEAR TECHNIQUES;

AUTOMATED VISION SYSTEM; ENHANCED STRIP ALGORITHM; ONLINE/POST PROCESS INSPECTION; PARTIAL DATA ELIMINATION; SCAN ALONG ALGORITHM; VERTEX RECOGNITION;

COMPUTER VISION;

EID: 0030171655     PISSN: 0307904X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0307-904X(95)00160-L     Document Type: Article

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