Visual Inspection Automation

Computer

Volumn 13, Issue 5, 1980, Pages 32-38

  Jarvis, John F ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INSPECTION;

PATTERN RECOGNITION SYSTEMS;

EID: 0019021186     PISSN: 00189162     EISSN: None     Source Type: Trade Journal    
DOI: 10.1109/MC.1980.1653617     Document Type: Article

References (9)

1. G. G. Dodd and L. Rossol, eds., Computer Vision and Sensor-Based Robots, Plenum Pub. Corp., New York, N.Y., 1979.
2. J. F. Jarvis, “Experiments in Visual Automation,” Proc. Joint Automatic Control Conf., Philadelphia, Oct. 18–20, 1978, pp. 307–313.
3. J. F. Jarvis, “Automatic Visual Inspection of Western Electric Type 700 Connectors,” Proc. IP77, IEEE Computer Society Conf. Pattern Recognition and Image Processing, Troy, N.Y., June 6–8, 1977, pp. 153–159.
4. J. Van Daele, A. Oosterlinck, and H. Van Den Berghe, “The Leuven Automatic Visual Inspection Machine (LAVIM),” Proc. SPIE, Imaging Applications for Automated Industrial Inspection and Assembly, Vol. 182, Washington, D.C., Apr. 1979, pp. 58–64.
5. J. F. Jarvis, “Automatic Visual Inspection of Glass-Metal Seals,” Proc. Fourth Int'l. Joint Conf. Pattern Recognition, Nov. 7–10, 1978, Kyoto, Japan, pp. 961–965.
6. F. L. A. M. Thissen, “An Equipment for Automatic Optical Inspection of Connecting-Lead Patterns for Integrated Circuits,” Philips Technical Review, Vol. 37, No. 4, 1977, pp. 77–88.
7. J. F. Jarvis, “Automatic Visual Inspection of Printed Wiring Boards by Local Pattern Matching,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 2, No. 1, Jan. 1980, pp. 77–82.
8. R.C. Restrick III, “An Automatic Optical Printed Circuit Inspection System,” Proc. SPIE, Solid-State Imaging Devices, Vol. 116, 1977, pp. 76–81.
9. Joseph Mundy and R. E. Joynson, “Automatic Visual Inspection Using Syntactic Analysis,” Proc. IP77, IEEE Computer Society Conf. Pattern Recognition and Image Processing, Troy, N.Y., June 6–8, 1977, pp. 144–147.