Cation sublattice stacking faults in Cu-rich chalcopyrite CuInSe2

Journal of Materials Research

Volumn 11, Issue 6, 1996, Pages 1398-1402

  Hellman, Olof ^a   Tanaka, Shun Ichiro ^a   Niki, Shigeru ^b   Fons, Paul ^b  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL STRUCTURE; FILM GROWTH; MOLECULAR BEAM EPITAXY; PHASE TRANSITIONS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; STACKING FAULTS; STOICHIOMETRY; SURFACE STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY;

CATION SUBLATTICE STACKING FAULTS; CHALCOPYRITE; COPPER INDIUM SELENIDE;

COPPER COMPOUNDS;

EID: 0030168172     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1996.0175     Document Type: Article

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