A TEM study of the crystallography and defect structures of single crystal and polycrystalline copper indium diselenide

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 63, Issue 6, 1991, Pages 1249-1273

  Kiely, C J ^a   Pond, R C ^a   Kenshole, G ^b,c   Rockett, A ^b  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^c UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS; CRYSTALLOGRAPHY; ELECTRONS - DIFFRACTION; MICROSCOPIC EXAMINATION - TRANSMISSION ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS - DEFECTS;

ANTISITE DEFECT DENSITIES; BRAGG REFLECTIONS; CONVERGENT BEAM ELECTRON DIFFRACTION; COPPER INDIUM DISELENIDE; DIFFUSE DIFFRACTION EFFECTS; SUPERDISLOCATIONS;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 0026171978     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619108205581     Document Type: Article

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