Open-ended metallized ceramic coaxial probe for high-temperature dielectric properties measurements

IEEE Transactions on Microwave Theory and Techniques

Volumn 44, Issue 6, 1996, Pages 926-935

  Bringhurst, Shane ^a   Iskander, Magdy F ^a  

^a University of Utah   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; DIELECTRIC PROPERTIES; ELECTRIC IMPEDANCE; HIGH TEMPERATURE PROPERTIES; MANGANESE; NICKEL PLATING; PERMITTIVITY MEASUREMENT; PROTECTIVE COATINGS;

ALUMINA ROD; ALUMINA TUBE; CHARACTERISTIC PROBE;

PROBES;

EID: 0030167466     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.506453     Document Type: Article

References (18)

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